Design and characterization of integrated passive elements on high ohmic silicon̈

IEEE MTT-S International Microwave Symposium Digest

Volumn 2, Issue , 2003, Pages 1235-1238

  Valletta, E ^a   Van Beek, J ^b   Den Dekker, A ^c   Pulsford, N ^c   Jos, H F F ^c   De Vreede, L C N ^a   Nanver, L K ^a   Burghartz, J N ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

^c NXP SEMICONDUCTORS   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; CURRENT VOLTAGE CHARACTERISTICS; MICROWAVES; WAVEGUIDES;

SILICON-INSULATOR INTERFACES;

SEMICONDUCTING SILICON;

EID: 0042092178     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)

1. D. Ahlgren et al. in Proc. BCTM, pp.80-83, 2002.
2. J. N. Burghartz et al., in Proc. BCTM, pp. 17-23, 2002.
3. B. Rejaei et al., in Proc. ESSDERC, pp.460-463, 2000.
4. B. Janiczak, in AEÜ, vol. 38, pp. 341-342, 1984.
5. N. Marchand, in Electronics, vol. 17, pp. 142-145, 1944.
6. R. Bawer et al., in MTT, pp. 319-325, 1960.
7. S. Basu, and S. A. Maas, in MTT, pag. 2028-2030, 1993.
8. H. Hasegawa et al., in MTT, pp. 869-881, 1971.
9. K. M. Strohm et al., in MTT, pp. 93-97, 1986.
10. C. Warns et al., in MTT, pp. 616-622, 1998.
11. A. B. Jansman et al, to be published in ESSDERC2003.
12. J. C. Tippet, et al., in MTT, pp. 661-666, 1982.
13. H. Dropkin, in MTT, pp. 79-81, 1983.
14. N. Nishikawa et al., in MTT, pp. 96-98, 1999.