AFM Study of the Behaviour of Growth Steps on the (100) Faces of KDP Crystals and the Tapering Phenomenon

Crystal Research and Technology

Volumn 34, Issue 5, 1999, Pages 667-675

  Sangwal, K ^a   Torrent Burgues, J ^b   Gorostiza, P ^c   Sanz, F ^c  

^a LUBLIN UNIVERSITY OF TECHNOLOGY   (Poland)

^b UNIVERSITAT POLITÈCNICA DE CATALUNYA   (Spain)

^c UNIVERSITY OF BARCELONA   (Spain)

Author keywords

Atomic force microscopy; Growth steps; KDP crystals; Potassium dihydrogen phosphate; Step bunching; Surface morphology; Tapering phenomenon

Indexed keywords

EID: 0042090721     PISSN: 02321300     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-4079(199906)34:5/6<667::AID-CRAT667>3.0.CO;2-L     Document Type: Article

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