메뉴 건너뛰기
Journal of Applied Physics
Volumn 62, Issue 9, 1987, Pages 3682-3687
Nuclear reaction analysis of shallow B and BF2 implants in Si
(3)
Ridgway, M C
a
Scanlon, P J
a
Whitton, J L
a
a
QUEEN S UNIVERSITY
(
Canada
)
Author keywords
[No Author keywords available]
Indexed keywords
EID
:
0042082475
PISSN
:
00218979
EISSN
:
None
Source Type
:
Journal
DOI
:
10.1063/1.339249
Document Type
:
Article
Times cited : (
15
)
References (
27
)
1
0019760909
(1981)
Nucl. Instrum. Methods
, vol.191
, pp. 327
Wittmaack, K.
1
Wach, W.
2
2
30244449630
(1971)
Nucl. Instrum. Methods
, vol.92
, pp. 481
Amsel, G.
1
Nadai, J.P.
2
D’Artemare, E.
3
David, D.
4
Girard, E.
5
Moulin, J.
6
3
0002596442
(1982)
Nucl. Instrum. Methods
, vol.197
, pp. 1
Maurel, B.
1
Amsel, G.
2
Nadai, J.P.
3
4
0000342102
(1983)
Nucl. Instrum. Methods
, vol.218
, pp. 183
Amsel, G.
1
Maurel, B.
2
5
51249190821
(1972)
J. Radioanal. Chem.
, vol.12
, pp. 335
Ligeon, E.
1
Bontemps, A.
2
6
0039355870
(Pergamon, New York)
(1977)
H Stopping Powers and Ranges
Anderson, H.H.
1
Ziegler, J.F.
2
7
0022757615
(1986)
Nucl. Instrum. Methods B
, vol.16
, pp. 479
Scanlon, P.J.
1
Farrell, G.
2
Ridgway, M.C.
3
Valizadeh, R.
4
8
0002172911
(1980)
Nucl. Instrum. Methods
, vol.168
, pp. 93
Dieumegard, D.
1
Maurel, B.
2
Amsel, G.
3
9
0020717350
(1983)
IEEE Electron Devices Lett.
, vol.EDL-4
, pp. 59
Liu, T.M.
1
Oldham, W.G.
2
10
0021375001
(1984)
Appl. Phys. Lett.
, vol.44
, pp. 404
Michel, A.E.
1
Kastl, R.H.
2
Mader, S.R.
3
Masters, B.J.
4
Gardner, J.A.
5
11
0021437159
(1985)
Can. J. Phys.
, vol.63
, pp. 890
Simard-Normandin, M.
1
Slaby, C.
2
12
0022237104
edited by D. K. Biegelsen, G. A. Rozgonyi, and C. V. Shank (Materials Research Society, Pittsburgh, PA)
(1985)
Energy Beam-Solid Interactions and Transient Thermal Processing/1984
, pp. 353-358
Calder, I.D.
1
Naguib, H.M.
2
Houghton, D.
3
Shepherd, F.R.
4
13
5544306236
(1969)
J. Electrochem. Soc.
, vol.116
, pp. 1143
Vick, G.L.
1
Whittle, K.M.
2
14
0013069535
(1975)
Philips Res. Rep.
Hofker, W.K.
1
15
84950591268
(1983)
Inst. Phys. Conf. Ser.
, vol.67
, pp. 143
Sadana, D.K.
1
Shatas, S.C.
2
Gat, A.
3
16
0021436813
(1985)
Can. J. Phys.
, vol.63
, pp. 863
Vandervorst, W.
1
Houghton, D.C.
2
Shepherd, F.R.
3
Swanson, M.L.
4
Plattner, H.H.
5
Carpenter, G.J.C.
6
17
5544266950
(1987)
J. Appl. Phys.
, vol.61
, pp. 985
Jagannadham, K.
1
Narayan, J.
2
18
0019565716
(1981)
J. Electrochem. Soc.
, vol.128
, pp. 1101
Schwarz, S.A.
1
Barton, R.W.
2
Ho, C.P.
3
Helms, C.R.
4
19
0022076075
(1985)
IEEE Electron Devices Lett.
, vol.EDL-6
, pp. 285
Sai-Halasz, G.A.
1
Short, K.T.
2
Williams, J.S.
3
20
0040394637
(1987)
J. Appl. Phys.
, vol.61
, pp. 1553
Sakamoto, K.
1
Nishi, K.
2
Ichikawa, F.
3
Ushio, S.
4
21
0003412161
(Pergamon, New York)
(1985)
The Stopping and Range of Ions in Solids
Ziegler, J.F.
1
Biersack, J.P.
2
Littmark, U.
3
22
0020900633
(1983)
J. Appl. Phys.
, vol.54
, pp. 6879
Wilson, R.G.
1
23
0007963827
(1985)
J. Appl. Phys.
, vol.58
, pp. 683
Seidel, T.E.
1
Knoell, R.
2
Poli, G.
3
Schwartz, B.
4
Stevie, F.A.
5
Chu, P.
6
24
36549101122
(1985)
J. Appl. Phys.
, vol.57
, pp. 2709
Narayan, J.
1
Holland, O.W.
2
Christie, W.H.
3
Wortman, J.J.
4
25
0018293253
(1979)
J. Appl. Phys.
, vol.50
, pp. 188
Tsai, M.Y.
1
Day, D.S.
2
Streetman, B.G.
3
Williams, P.
4
Evans, C.A.
5
26
0019076212
(1980)
J. Electrochem. Soc.
, vol.127
, pp. 2227
Swaminathan, B.
1
Demoulin, E.
2
Sigmon, T.W.
3
Dutton, R.W.
4
Reif, R.
5
27
33846976400
(1987)
J. Appl. Phys.
, vol.61
, pp. 2189
Young, N.D.
1
Clegg, J.B.
2
Maydell-Ondrusz, E.A.
3
* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.