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Volumn 81, Issue 1-4, 2003, Pages 125-132

Charge correlation effects in electron broadening of ion emitters in hot and dense plasmas

Author keywords

Charge correlations; Electron broadening; Line shapes; Molecular dynamics; Plasma spectroscopy; Simulations

Indexed keywords

CHARGED PARTICLES; CORRELATION DETECTORS; ELECTRIC FIELDS; ELECTRON GAS; IONS; MOLECULAR DYNAMICS; SPECTROSCOPY; COMPUTER SIMULATION; CORRELATION METHODS; ELECTRONS; ION SOURCES;

EID: 0042066534     PISSN: 00224073     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-4073(03)00066-9     Document Type: Article
Times cited : (6)

References (13)
  • 4
    • 85028773484 scopus 로고
    • Van Kampen NG. Fundamental problems in statistical mechanics III. In: Cohen EGD editor. Wageningen summer school. North-Holland: American Elsevier. 1975.
    • Van Kampen NG. Fundamental problems in statistical mechanics III. In: Cohen EGD editor. 1974 Wageningen summer school. North-Holland: American Elsevier. 1975.
    • (1974)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.