Threshold height for movement of C60 molecules on Si(111)-7×7 with a scanning tunneling microscope

Applied Physics Letters

Volumn 63, Issue 10, 1993, Pages 1339-1341

  Maruno, S ^a   Inanaga, K ^a   Isu, T ^a  

^a MITSUBISHI ELECTRIC CORPORATION   (Japan)

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EID: 0042059918     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.109724     Document Type: Article

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