Quantitative EELS by spectrum parametrization

Microscopy Microanalysis Microstructures

Volumn 8, Issue 6, 1997, Pages 369-378

  Aitouchen, Abdelaziz ^a   Kihn, Yolande ^a   Zanchi, Gérald ^a  

^a CEMES CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042053956     PISSN: 11542799     EISSN: None     Source Type: Journal    
DOI: 10.1051/mmm:1997128     Document Type: Article

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