Cross-sectional atomic force imaging of semiconductor heterostructures

Materials Science and Engineering B

Volumn 37, Issue 1-3, 1996, Pages 83-88

  Dwir, B ^a   Reinhardt, F ^a   Biasiol, G ^a   Kapon, E ^a  

^a EPFL   (Switzerland)

Author keywords

Atomic force microscopy; Heterostructures; Quantum wells; Semiconductor

Indexed keywords

EID: 0042037676     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/0921-5107(95)01460-8     Document Type: Article

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