Conduction and trapping of electrons in highly stressed ultrathin films of thermal SiO2

Applied Physics Letters

Volumn 30, Issue 11, 1977, Pages 601-603

  Harari, Eli ^a  

^a Hughes Airgraft Company ^*

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042035020     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.89252     Document Type: Article

References (6)