In situ monitoring of polyimide windows for external ion microbeams

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 210, Issue , 2003, Pages 75-78

  Kinomura, A ^a   Mokuno, Y ^a   Chayahara, A ^a   Tsubouchi, N ^a   Horino, Y ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Damage; External microbeam; In situ monitoring; MeV proton; Polyimide window

Indexed keywords

BACKSCATTERING; HEAVY IONS; IRRADIATION; MICROANALYSIS; POLYIMIDES;

MICROBEAMS;

PROTON BEAMS;

EID: 0042013969     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(03)01024-3     Document Type: Conference Paper

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