Evaluation of shear compliant borders for wrinkle reduction in thin film membrane structures

Collection of Technical Papers - AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics and Materials Conference

Volumn 7, Issue , 2003, Pages 5325-5331

  Leifer, J ^a   Black, J T ^b   Belvin, W K ^c   Behun, V ^d  

^a UNIVERSITY OF KENTUCKY   (United States)

^b GEORGE WASHINGTON UNIVERSITY   (United States)

^c NASA LANGLEY RESEARCH CENTER   (United States)

^d NORTHROP GRUMMAN CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AEROSPACE ENGINEERING; COMPUTER SIMULATION; FINITE ELEMENT METHOD; MEMBRANES; PHOTOGRAMMETRY; SURFACE MEASUREMENT; TENSILE TESTING; THIN FILMS;

SHEAR COMPLIANT BORDERS; THIN FILM MEMBRANE STRUCTURES; ULTRA-LIGHTWEIGHT SPACE STRUCTURE; WRINKLE REDUCTION;

SPACECRAFT EQUIPMENT;

EID: 0041977032     PISSN: 02734508     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.2514/6.2003-1984     Document Type: Conference Paper

References (4)

1. Talley, C., Clayton, W., Gierow, P., McGee, J. and Moore, J., Advanced Membrane Materials for Improved Solar Sail Capabilities, Paper 2002-1561, 3rd Gossamer Spacecraft Forum, Denver, CO, April 2002.
2. Leifer, J. and Belvin, W. K., Prediction of Wrinkle Amplitude in Thin Film Membranes using Finite Element Modeling, submitted for presentation at the AIAA 4th Gossamer Spacecraft Forum, Norfolk, VA, April 2003.
3. Pappa, R. S., Jones, T. W., Black, J. T., et al., Photogrammetry Methodology Development for Gossamer Spacecraft Structures, Paper 2002-1375, 3rd Gossamer Spacecraft Forum, Denver, CO, April 2002.
4. Dharamsi, U. K., Evanchik, D. M. and Blandino, J. R., Comparing Photogrammetry with a Conventional Displacement Measurement Technique on a 0.5m Square Kapton Membrane, Paper 2002-1258, 3rd Gossamer Spacecraft Forum, Denver, CO, April 2002.