Y-Ba-Cu-O grain boundary resistivity above and below the critical temperature

IEEE Transactions on Applied Superconductivity

Volumn 13, Issue 2 III, 2003, Pages 2886-2889

  Ransley, James H T ^a   Mennema, Sibe H ^a   Burnell, Gavin ^a   Balasumbramaniam, Ugi ^a   Tarte, Edward J ^a   Blamire, Mark G ^a   Evetts, Jan E ^a   Kye, Jeong Il ^b   Oh, Byungdu ^b  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b LG Electronics Inc   (South Korea)

Author keywords

Grain boundaries; High temperature superconductors; Resistivity

Indexed keywords

CRITICAL CURRENTS; DATA REDUCTION; ELECTRIC CONDUCTIVITY; SUPERCONDUCTING MATERIALS; YTTRIUM COMPOUNDS;

GRAIN BOUNDARY RESISTIVITY;

GRAIN BOUNDARIES;

EID: 0041975147     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2003.812033     Document Type: Conference Paper

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