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Volumn 13, Issue 2 III, 2003, Pages 2909-2912

Surface resistance measurements of HTS thin films using SLAO dielectric resonator

Author keywords

Dielectric resonator; High temperature superconductor; Surface resistance

Indexed keywords

DIELECTRIC DEVICES; NATURAL FREQUENCIES; THIN FILMS;

EID: 0041975130     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2003.812044     Document Type: Conference Paper
Times cited : (7)

References (12)
  • 2
    • 36549098152 scopus 로고
    • Novel technique to measure the microwave response of HTS between 4.2 and 200 K
    • S. Sridhar and W. L. Kennedy, "Novel technique to measure the microwave response of HTS between 4.2 and 200 K," Review of Scientific Instruments, vol. 59, no. 4, pp, 531-536, 1988.
    • (1988) Review of Scientific Instruments , vol.59 , Issue.4 , pp. 531-536
    • Sridhar, S.1    Kennedy, W.L.2
  • 5
    • 0031121666 scopus 로고    scopus 로고
    • Dielectric resonator as a possible standard for characterization of HTS superconducting films for microwave applications
    • J. Mazierska, "Dielectric resonator as a possible standard for characterization of HTS superconducting films for microwave applications," Journal of Superconductivity, vol. 10, no. 2, pp. 73-85, 1997.
    • (1997) Journal of Superconductivity , vol.10 , Issue.2 , pp. 73-85
    • Mazierska, J.1
  • 9
    • 0002094557 scopus 로고    scopus 로고
    • Accurate measurements of surface resistance of HTS films using a novel transmission mode Q-factor technique
    • K. Leong and J. Mazierska, "Accurate measurements of surface resistance of HTS films using a novel transmission mode Q-factor technique," Journal of Superconductivity, vol. 14, no. 1, pp. 93-103, 2001.
    • (2001) Journal of Superconductivity , vol.14 , Issue.1 , pp. 93-103
    • Leong, K.1    Mazierska, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.