A non-destructive, non-contact, quality test of critical current for Ag-BiSCCO tape

IEEE Transactions on Applied Superconductivity

Volumn 13, Issue 2 III, 2003, Pages 3332-3334

  Gandini, Alberto ^a   Weinstein, Roy ^a   Parks, Drew ^a   Sawn, Ravi Persad ^a   Dou, Shi Xue ^b  

^a University of Houston   (United States)

^b UNIVERSITY OF WOLLONGONG   (Australia)

Author keywords

BiSCCO tape; Critical current density; High temperature superconductors; Trapped magnetic field

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); HIGH TEMPERATURE SUPERCONDUCTORS; MAGNETIC FIELD EFFECTS;

TRANSPORT CURRENTS;

SUPERCONDUCTING TAPES;

EID: 0041974803     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2003.812305     Document Type: Conference Paper

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