Possible artefacts in measurement of hardness and elastic modulus on superhard coatings and the verification of the correctness of the data

Materials Research Society Symposium - Proceedings

Volumn 750, Issue , 2002, Pages 9-14

  Veprek, S ^a   Mukherjee, S ^a,f   Karvankova, P ^a   Mannling H D ^a   He, J L ^a   Xu, J ^a   Prochazka, J ^a   Argon, A S ^b   Li, A S ^c   Fang, Q F ^c   Li, S Z ^d   Manghnani, M H ^e   Tkachev, S ^e   Zinin, P ^e  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^b Massachusetts Institute of Technology Cambridge   (United States)

^c INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

^d Oingdao Univ of Chemical Technology   (China)

^e UNIVERSITY OF HAWAII   (United States)

^f BHABHA ATOMIC RESEARCH CENTRE   (India)

Author keywords

[No Author keywords available]

Indexed keywords

BRILLOUIN SCATTERING; ELASTIC MODULI; HARDNESS; INDENTATION; PLASTIC DEFORMATION; SCANNING ELECTRON MICROSCOPY;

SUPERHARD COATINGS;

PROTECTIVE COATINGS;

EID: 0041967077     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-750-y1.3     Document Type: Conference Paper

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