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Volumn 750, Issue , 2002, Pages
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Surface engineering 2002 - Synthesis, characterization and applications
[No Author Info available]
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
BRASS;
CHROMIUM COMPOUNDS;
ELASTIC MODULI;
GRAIN BOUNDARIES;
HARDNESS;
INDENTATION;
MICROSTRUCTURE;
PHYSICAL VAPOR DEPOSITION;
PLASTICITY;
SHAPE MEMORY EFFECT;
STACKING FAULTS;
STRAIN;
THIN FILMS;
TRIBOLOGY;
WEAR RESISTANCE;
ATOMIC RESOLUTION;
BRITTLE COATINGS;
CATHODIC ARC DEPOSITION;
EIREV;
HARD COATINGS;
MICROINDENTATION;
STRAIN GRADIENT;
SUPERELASTICITY;
SUPERHARD COATINGS;
PROTECTIVE COATINGS;
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EID: 0041966005
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Review |
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Times cited : (3)
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References (0)
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