A method to overcome self-heating effects in SOI MOSFETs

Biennial University/Government/Industry Microelectronics Symposium - Proceedings

Volumn , Issue , 2003, Pages 295-297

  Cole, Bryan ^a,b   Parke, Stephen ^b  

^a MICRON TECHNOLOGY INC   (United States)

^b Boise State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY; ELECTRIC POTENTIAL; MOS DEVICES; SILICON ON INSULATOR TECHNOLOGY; THERMAL CONDUCTIVITY;

SILICON FILMS;

MOSFET DEVICES;

EID: 0041939990     PISSN: 07496877     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)

1. Garner, D. M., Udrea, F., Lim, H. T., and Milne, W. I., Solid State Electronics, Volume 44, 1267-1280, 2000.
2. Wensong, C., Lilin, T., and Zhijian, L., IEEE SOI Conference, pp. 575-578, 1998.