Wideband frequency metrology using high temperature superconducting Josephson junctions

IEEE Transactions on Applied Superconductivity

Volumn 13, Issue 2 I, 2003, Pages 1143-1146

  Chen, Jian ^a   Kurigata, Yuhei ^a   Wang, Huabing ^a   Nakajima, Kensuke ^a   Yamashita, Tsutomu ^a   Wu, Peiheng ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b NANJING UNIVERSITY   (China)

Author keywords

Frequency metrology; High temperature superconducting (HTS) Josephson junction; Monochromatic and polychromatic electromagnetic irradiation and detection; Terahertz (THz)

Indexed keywords

ELECTRIC RESISTANCE; ELECTROMAGNETIC WAVES; HIGH TEMPERATURE SUPERCONDUCTORS; LASER RESONATORS;

FREQUENCY METROLOGY;

SEMICONDUCTOR JUNCTIONS;

EID: 0041939891     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2003.814176     Document Type: Conference Paper

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