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Volumn 53, Issue 4, 1996, Pages 3408-3413
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Self-organized criticality in a hierarchical model of defects development
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0041938365
PISSN: 1063651X
EISSN: None
Source Type: Journal
DOI: 10.1103/PhysRevE.53.3408 Document Type: Article |
Times cited : (11)
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References (16)
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