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Volumn 358, Issue 1-2, 2003, Pages 182-187
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Crystal growth and some properties of REMn2Si2 (RE = Y, Tb, Dy, Ho)
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Author keywords
Hardness; Lead flux; Magnetic susceptibility; REMn2Si2 (RE = Y, Tb, Dy, Ho); Single crystal; Thermal property
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Indexed keywords
ARGON;
CRYSTAL GROWTH;
MAGNETIC SUSCEPTIBILITY;
MICROHARDNESS;
OXIDATION RESISTANCE;
SINGLE CRYSTALS;
THERMODYNAMIC PROPERTIES;
VICKERS HARDNESS TESTING;
LEAD FLUX;
YTTRIUM COMPOUNDS;
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EID: 0041931998
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/S0925-8388(03)00010-0 Document Type: Article |
Times cited : (9)
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References (12)
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