Measurement of optical nonlinearity in silicon rich nitride waveguide ring resonators

Electronics Letters

Volumn 39, Issue 16, 2003, Pages 1184-1185

  Philipp, H T ^a   Svendsen, W ^a   Andersen, K N ^a   Hubner J ^a   Hedegaard Povlsen, J ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD EFFECTS; OPTICAL RESONATORS; OPTICAL WAVEGUIDES; REFRACTIVE INDEX; SILICA;

RING RESONATORS;

NONLINEAR OPTICS;

EID: 0041929227     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20030771     Document Type: Article

References (6)

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2. MADSEN, C.K., and ZHAO, J.H.: 'Optical filter design and analysis: signal processing approach' (John Wiley & Sons Inc., New York, 1999)
3. OKAMOTO, K.: 'Fundamentals of optical waveguides' (Academic Press, San Diego, 2000)
4. ANDERSEN, K.N., SVENDSEN, W.E., SANDBERG, R.K., PHILIPP, H.T., and HÜBNER, J.: 'Silicon rich nitride micro-resonators'. Proc. ECIO 2003, Prague, Czech Republic, Vol. 1, p. 43
5. SALEH, B.E.A., and TEICH, M.C.: 'Fundamentals of photonics' (John Wiley & Sons Inc., New York, 1991)
6. MARCKMANN, C.J., SHIM, R., REN, Y., and KRISTENSEN, M.: 'Interpretation of high poling effects with short lifetimes'. Proc. ECIO 2003, Prague, Czech Republic, Vol. 1, p. 301