Probing nanostructures site by site with the aberration-corrected STEM

Microscopy and Microanalysis

Volumn 9, Issue SUPPL. 2, 2003, Pages 2-3

  Pennycook, S J ^a,b   Lupini, A R ^a   Varela, M ^a   Borisevich, A ^a   Peng, Y ^a   Buczko, R ^a,b,c   Fan, X ^a,d   McBride, J R ^b   Kippeny, T C ^b   Rosenthal, S J ^b   Franceschetti, A ^a,b   Pantelides, S T ^a,b  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b VANDERBILT UNIVERSITY   (United States)

^c INSTITUTE OF PHYSICS   (Poland)

^d MICHIGAN STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041923780     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s143192760344124x     Document Type: Conference Paper

References (2)

1. M. Kim et al, Phys. Rev. Lett. 86 (2001) 4056
2. S. J. Pennycook et al., Proc. MRS 748 (2003) G1.1