FIB dual-beam sample preparation for TEM observation

Microscopy and Microanalysis

Volumn 9, Issue SUPPL. 2, 2003, Pages 870-871

  Auvert, Geoffroy ^a  

^a CEA LETI   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041920916     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927603444358     Document Type: Conference Paper

References (2)

1. V.E.Cosslett and R.N.Thomas, Brit. J. Appl. Phys. 15(1964) 1283.
2. T.E.Everhart and P. H. Hoff, J. Appl. Physics, Vol. 42, 5837, December 1971.