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Volumn 72, Issue 1, 2000, Pages 1-21

On the Loss of Information Due to Nonrandom Truncation

Author keywords

Blackwell sufficiency; Deficiency distance; Extreme value models; Hellinger distance; Local asymptotic normality; Peaks over threshold method; Point process; Statistical experiment

Indexed keywords


EID: 0041910159     PISSN: 0047259X     EISSN: None     Source Type: Journal    
DOI: 10.1006/jmva.1999.1850     Document Type: Article
Times cited : (3)

References (20)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.