Force measurement in a nanomachining instrument

Review of Scientific Instruments

Volumn 71, Issue 11, 2000, Pages 4325-4329

  Gao, Wei ^a   Hocken, Robert J ^b   Patten, John A ^b   Lovingood, John ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b University of North Carolina at Charlotte   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041908164     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1319976     Document Type: Article

References (23)

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