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Volumn 119, Issue 8, 2003, Pages 4529-4538

Microscopic diffusion model applied to C60 fullerene fractals in carbon disulphide solution

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; CARRIER CONCENTRATION; DIFFUSION; INTERFACIAL ENERGY; MATHEMATICAL MODELS; MOLECULAR STRUCTURE; POSITRONS; PROBABILITY DENSITY FUNCTION; REACTION KINETICS; SOLUTIONS; SULFUR COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0041879932     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1594177     Document Type: Article
Times cited : (25)

References (48)
  • 36
    • 0020221852 scopus 로고
    • edited by P. G. Coleman, S. C. Sharma, L. Diana (North-Holland, Amsterdam)
    • H. J. Ache, in Positron Annihilation, edited by P. G. Coleman, S. C. Sharma, L. Diana (North-Holland, Amsterdam, 1982), p. 773.
    • (1982) Positron Annihilation , pp. 773
    • Ache, H.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.