Size-dependent charge storage in amorphous silicon quantum dots embedded in silicon nitride

Applied Physics Letters

Volumn 83, Issue 5, 2003, Pages 1014-1016

  Park, Nae Man ^a,c   Jeon, Sang Hun ^a   Yang, Hyun Deok ^a   Hwang, Hyunsang ^a   Park, Seong Ju ^a   Choi, Suk Ho ^b  

^a Gwangju Institute of Science and Technology (GIST)   (South Korea)

^b Kyung Hee University   (South Korea)

^c Electronics and Telecommunications Research Institute (ETRI)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; CARRIER CONCENTRATION; ELECTRIC CHARGE; ELECTRIC DISCHARGES; ELECTROSTATICS; HYSTERESIS; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; QUANTUM THEORY; SEMICONDUCTOR QUANTUM DOTS; SILICON NITRIDE; VOLTAGE MEASUREMENT;

QUANTUM CONFINEMENTS;

AMORPHOUS SILICON;

EID: 0041876430     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1596371     Document Type: Article

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