Comments on "on the concepts used in return stroke models applied in engineering practice" (multiple letters)

IEEE Transactions on Electromagnetic Compatibility

Volumn 45, Issue 3, 2003, Pages 567-568

  Rakov, V A ^a   Thottappillil, R ^b   Schoene, J ^a   Cooray, Vernon ^b  

^a UNIVERSITY OF FLORIDA   (United States)

^b UPPSALA UNIVERSITY   (Sweden)

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[No Author keywords available]

Indexed keywords

EID: 0041861338     PISSN: 00189375     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEMC.2003.815519     Document Type: Letter

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