Numerical simulations of laser/defect induced absorption in SiO2

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4932, Issue , 2003, Pages 250-257

  Bonneau, F ^a   Combis, P ^a   Pujols, A ^b   Rullier, J L ^a   Sesques, M ^b   Vierne, J ^a  

^a CEA DAM DIF   (France)

^b CEA CESTA   (France)

Author keywords

Cracks; Fused silica; Gold inclusions; Laser induced damage; Laser matter interaction; Numerical simulations

Indexed keywords

BRITTLENESS; COMPUTER SIMULATION; CRACK INITIATION; LIGHT ABSORPTION; MORPHOLOGY; SILICA;

ELECTRIC FIELD ENHANCEMENT;

LASER DAMAGE;

EID: 0041861065     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.472408     Document Type: Conference Paper

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