Shear properties of polarized PVF2 film studied by the piezoelectric resonance method

Journal of Applied Physics

Volumn 50, Issue 8, 1979, Pages 5511-5512

  Auld, B A ^a   Gagnepain, J J ^b  

^a STANFORD UNIVERSITY   (United States)

^b CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041859927     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.326607     Document Type: Article

References (8)