Inverse ultrasonic determination of imperfect interfaces and bulk properties of a layer between two solids

Journal of the Acoustical Society of America

Volumn 114, Issue 3, 2003, Pages 1424-1434

  Baltazar, A ^a   Wang, L ^a   Xie, B ^a   Rokhlin, S I ^a  

^a OHIO STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; INTERFACES (MATERIALS); STIFFNESS; ULTRASONIC REFLECTION;

INTERFACIAL STIFFNESS;

ULTRASONIC APPLICATIONS;

ACOUSTICS;

ARTICLE; DENSITY; ECHOGRAPHY; GEOMETRY; PRIORITY JOURNAL; REFLECTOMETRY; SOLID; VALIDATION PROCESS; YOUNG MODULUS;

EID: 0041828305     PISSN: 00014966     EISSN: None     Source Type: Journal    
DOI: 10.1121/1.1600723     Document Type: Article

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