-
1
-
-
0042489355
-
-
Berlin, Germany: Verlag Harri Deutsch. in German
-
J. Frisius, Von Coulomb bis Einstein. Berlin, Germany: Verlag Harri Deutsch, 1998, pp. 71-77. (in German).
-
(1998)
Von Coulomb bis Einstein
, pp. 71-77
-
-
Frisius, J.1
-
2
-
-
0002554308
-
Contact electricity of metals
-
May
-
L. Kelvin, "Contact electricity of metals," Philos. Mag. & J. Sci., vol. 46, pp. 82-120, May 1898.
-
(1898)
Philos. Mag. & J. Sci.
, vol.46
, pp. 82-120
-
-
Kelvin, L.1
-
3
-
-
0041988516
-
Einstein's photoelectric equation and contact electromotive force
-
July
-
R. A. Millikan, "Einstein's photoelectric equation and contact electromotive force," Phys. Rev., vol. VII, pp. 18-32, July 1916.
-
(1916)
Phys. Rev.
, vol.7
, pp. 18-32
-
-
Millikan, R.A.1
-
4
-
-
36849122398
-
A new method of measuring contact potential differences in metals
-
Mar.
-
W. A. Zisman, "A new method of measuring contact potential differences in metals," Rev. Sci. Instrum., vol. 4, pp. 367-370, Mar. 1932.
-
(1932)
Rev. Sci. Instrum.
, vol.4
, pp. 367-370
-
-
Zisman, W.A.1
-
5
-
-
0016058413
-
A new pendulum device to measure contact potential differences
-
Mar.
-
J. Hölzl and P. Schrammen, "A new pendulum device to measure contact potential differences," Appl. Phys., vol. 3, pp. 353-357, Mar. 1974.
-
(1974)
Appl. Phys.
, vol.3
, pp. 353-357
-
-
Hölzl, J.1
Schrammen, P.2
-
6
-
-
0041487512
-
Rotating electrometer for comparative work function measurements
-
Dec.
-
H. H. Kolm, "Rotating electrometer for comparative work function measurements," Rev. Sci. Instrum., vol. 27, pp. 1046-1048, Dec. 1956.
-
(1956)
Rev. Sci. Instrum.
, vol.27
, pp. 1046-1048
-
-
Kolm, H.H.1
-
7
-
-
0021497963
-
Vibrating capacitor measurement of surface charge
-
L. B. Harris and J. Fiasson, "Vibrating capacitor measurement of surface charge," J. Phys. E. Sci. Instrum., vol. 17, pp. 788-792, 1984.
-
(1984)
J. Phys. E. Sci. Instrum.
, vol.17
, pp. 788-792
-
-
Harris, L.B.1
Fiasson, J.2
-
8
-
-
0041988521
-
-
Ph.D. dissertation, Universität der Bundeswehr, München, Germany
-
J. Ren, "Modulated scanning-Kelvin-microscope for quantitative contact potential difference measurement with lateral resolution," Ph.D. dissertation, Universität der Bundeswehr, München, Germany, 1995.
-
(1995)
Modulated Scanning-Kelvin-microscope for Quantitative Contact Potential Difference Measurement with Lateral Resolution
-
-
Ren, J.1
-
9
-
-
0016980534
-
Piezoelectric driven Kelvin probe for contact potential difference studies
-
July
-
K. Besocke and S. Berger, "Piezoelectric driven Kelvin probe for contact potential difference studies," Rev. Sci. Instrum., vol. 47, pp. 840-842, July 1976.
-
(1976)
Rev. Sci. Instrum.
, vol.47
, pp. 840-842
-
-
Besocke, K.1
Berger, S.2
-
10
-
-
0006200904
-
Design and performance of a Kelvin probe for the study of topographic work functions
-
J. M. Palau and J. Bonnet, "Design and performance of a Kelvin probe for the study of topographic work functions," J. Phys. E, Sci. Instrum., vol. 21, pp. 674-679, 1988.
-
(1988)
J. Phys. E, Sci. Instrum.
, vol.21
, pp. 674-679
-
-
Palau, J.M.1
Bonnet, J.2
-
11
-
-
0016930654
-
Electrostatically driven apparatus for measuring work function differences
-
S. C. Fain Jr., L. V. Corbin II, and J. M. McDavid, "Electrostatically driven apparatus for measuring work function differences," Rev. Sci. Instrum., vol. 47, pp. 345-347, 1976.
-
(1976)
Rev. Sci. Instrum.
, vol.47
, pp. 345-347
-
-
Fain S.C., Jr.1
Corbin L.V. II2
McDavid, J.M.3
-
12
-
-
36448999364
-
Two-dimensional surface dopant profiling in silicon using scanning Kelvin probe microscopy
-
A. K. Henning, T. Hochwitz, J. Slinkman, J. Never, S. Hoffmann, P. Kaszuba, and C. Daghlian, "Two-dimensional surface dopant profiling in silicon using scanning Kelvin probe microscopy," J. Appl. Phys., vol. 77, pp. 1888-1896, 1995.
-
(1995)
J. Appl. Phys.
, vol.77
, pp. 1888-1896
-
-
Henning, A.K.1
Hochwitz, T.2
Slinkman, J.3
Never, J.4
Hoffmann, S.5
Kaszuba, P.6
Daghlian, C.7
-
13
-
-
10944247907
-
COCOS (corona oxide characterization of semiconductor) metrology: Physical principles and applications
-
San Jose, CA, Jan.
-
M. Wilson, J. Lagowski, A. Savtchouk, L. Jastrzebski, and J. D'Amico, "COCOS (corona oxide characterization of semiconductor) metrology: Physical principles and applications," presented at the ASTM Conf. Gate Dielectric Oxide Integrity, San Jose, CA, Jan. 1999.
-
(1999)
ASTM Conf. Gate Dielectric Oxide Integrity
-
-
Wilson, M.1
Lagowski, J.2
Savtchouk, A.3
Jastrzebski, L.4
D'Amico, J.5
-
14
-
-
0042990149
-
Electron work functions of the elements
-
D. R. Lide, Ed.
-
H. B. Michaelson, "Electron work functions of the elements," in CRC Handbook of Chemistry and Physics, 73rd ed., D. R. Lide, Ed., 1992, pp. (12)108-(12)109.
-
(1992)
CRC Handbook of Chemistry and Physics, 73rd Ed.
, pp. 12108-12109
-
-
Michaelson, H.B.1
|