Surface morphological study of J-aggregate thin films by atomic force microscopy

Langmuir

Volumn 14, Issue 2, 1998, Pages 565-568

  Daehne, Lars ^a   Tao, Jian ^b   Mao, Guangzhao ^b  

^a FREIE UNIVERSITÄT BERLIN   (Germany)

^b Wayne State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041801598     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la9707989     Document Type: Article

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