Flux pinning property of artificial pinning center introduced by microfabrication

Physica C: Superconductivity and its Applications

Volumn 392-396, Issue PART 2, 2003, Pages 1043-1047

  Harada, N ^a   Yamada, H ^a   Sugai, K ^a   Munechika, I ^a   Tsuda, M ^a   Hamajima, T ^a  

^a YAMAGUCHI UNIVERSITY   (Japan)

Author keywords

Critical current; Flux pinning; Microfabrication; Pinning center

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); ETCHING; MAGNETIZATION; MAGNETOMETERS; PHOTOLITHOGRAPHY;

FLUX PINNING;

SUPERCONDUCTING TAPES;

EID: 0041783041     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(03)01181-X     Document Type: Conference Paper

References (16)

1. Yamafuji K., Harada N., Mawatari Y., Funaki K., Matsushita T., Matsumoto K., Miura O., Tanaka Y. Cryogenics. 31:1991;431.
2. Miura O., Matsumoto K., Tanaka Y., Yamafuji K., Harada N., Iwakuma M., Funaki K., Matsuhita T. Cryogenics. 32:1992;315.
3. Heussner R.W., Nunes C.B., Cooly L.D., Larbalestier D.C. IEEE Trans. Appl. Supercond. 7:1997;1142.
4. Yamada H., Harada N., Iwamoto T., Makoto T., Hamajima T. IEEE Trans. Appl. Supercond. 11:2001;3816.
5. Yamada H., Harada N., Iwamoto T., Sugai K., Makoto T., Hamajima T. IEEE Trans. Appl. Supercond. 12:2002;1113.
6. Lykov A.N. Solid State Commun. 86:1993;531.
7. Metlushko V., Welp U., Crabtree G.W. Phys. Rev. B. 60:1999;12585.
8. Daldini O., Martionli P., Olsen J.L. Phys. Rev. Lett. 32:1974;218.
9. Morison D.D., Rose R.M. Phys. Rev. Lett. 25:1970;356.
10. Baert M., Metlushko V.V., Potter C.D., Rosseel E., Temst K., Jonckheere R., Gilabert A., Moshchalkov V.V., Bruynseraede Y. Physica C. 235-240:1994;2791.
11. Moshchalkov V.V. Phys. Rev. B. 57:1998;3615.
12. Moshchalkov V.V., Baert M., Metlushko V.V., Rosseel E., Bael M.J.V., Temst K. Phys. Rev. B. 54:1996;7385.
13. Kleiner W.H., Roth L.M., Autler S.H. Phys. Rev. 133:1964;1226.
14. Matsushita T. Jpn. J. Appl. Phys. 20:1981;1955.
15. Brandt E.H. Phys. Rev. B. 34:1986;6514.
16. Campbell A.M. J. Phys. C. 4:1971;3186.