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Journal of Applied Physics
Volumn 64, Issue 3, 1988, Pages 1586-1588
A submicrometer Nb/AlOx/Nb Josephson junction
(2)
Imamura, Takeshi
a
Hasuo, Shinya
a
a
FUJITSU LABORATORIES LTD
(
Japan
)
Author keywords
[No Author keywords available]
Indexed keywords
EID
:
0041777108
PISSN
:
00218979
EISSN
:
None
Source Type
:
Journal
DOI
:
10.1063/1.341792
Document Type
:
Article
Times cited : (
54
)
References (
11
)
1
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2
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3
2
36749108668
(1983)
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Gurvitch, M.
1
Washington, M.A.
2
Huggins, H.A.
3
3
0005145324
(1985)
Appl. Phys. Lett.
, vol.46
, pp. 1179
Morohashi, S.
1
Shinoki, F.
2
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3
Aoyagi, M.
4
Hayakawa, H.
5
4
0022893112
Tokyo
(1986)
Extended Abstracts of the International Conference on Solid State Devices and Materials
, pp. 447
Hoko, K.
1
Yoshida, A.
2
Tamura, H.
3
Imamura, T.
4
Hasuo, S.
5
5
0023438608
(1987)
IEEE J. Solid-State Circuits
, vol.SC-22
, pp. 886
Fujimaki, N.
1
Kotani, S.
2
Imamura, T.
3
Hasuo, S.
4
6
84952859416
New York
(1987)
International Solid State Circuits Conference, Digest of Technical Papers
, pp. 60
Kotani, S.
1
Fujimaki, N.
2
Imamura, T.
3
Hasuo, S.
4
7
84952859595
(to be published).
IEEE J. Solid-State Circuits
Fujimaki, N.
1
Imamura, T.
2
Hasuo, S.
3
8
0023015727
Los Angeles
(1986)
Technical Digest of the International Electron Devices Meeting
, pp. 93
Kotani, S.
1
Imamura, T.
2
Hasuo, S.
3
9
0020128248
(1983)
IEEE Trans. Magn.
, vol.MAG-19
, pp. 787
Smith, L.N.
1
Kroger, H.
2
Jillie, D.W.
3
10
0018807512
(1979)
Thin Solid Films
, vol.64
, pp. 103
Wu, C.T.
1
11
84952859589
(unpublished)
Imamura, T.
1
Hasuo, S.
2
* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.
