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Volumn 42, Issue 28, 2003, Pages 3254-3257

Controlling van der Waals contacts in complexes of fullerene C60

Author keywords

Aggregation; Calixarenes; Crystal growth; Fullerenes; Host guest systems

Indexed keywords

CRYSTALLIZATION; IMPURITIES; PURIFICATION; TOLUENE; VAN DER WAALS FORCES;

EID: 0041766626     PISSN: 14337851     EISSN: None     Source Type: Journal    
DOI: 10.1002/anie.200351033     Document Type: Article
Times cited : (69)

References (24)
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    • T. Haino, M. Yanase, Y. Fukazawa, Angew. Chem. 1997, 109, 288-289; Angew. Chem. Int. Ed. Engl. 1997, 36, 259-260.
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    • T. Haino, M. Yanase, Y. Fukazawa, Angew. Chem. 1998, 110, 1044-1046; Angew. Chem. Int. Ed. 1998, 37, 997-998.
    • (1998) Angew. Chem. Int. Ed. , vol.37 , pp. 997-998
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    • note
    • -1. All X-ray structure figures were prepared with X-Seed.[21] CCDC-202602 contains the supplementary crystallographic data for this paper. These data can be obtained free of charge via www.ccdc.cam.ac.uk/conts/retrieving.html (or from the Cambridge Crystallographic Data Centre, 12, Union Road, Cambridge CB21EZ, UK; fax: (+44)1223-336-033; or deposit@ccdc.cam.ac.uk).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.