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Volumn 34, Issue 7-8, 2003, Pages 519-523
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Raman scattering studies at high pressure and low temperature: Technique and application to the piezoelectric material Pbzr0.52Ti 0.48O3
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Author keywords
High pressure; High temperature; Lead zirconate titanate; Perovskite; Phase transition
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Indexed keywords
FERROELECTRIC CERAMICS;
HIGH PRESSURE ENGINEERING;
LEAD ZIRCONATE TITANATE;
PHASE DIAGRAMS;
PIEZOELECTRICITY;
RAMAN SCATTERING;
RAMAN SPECTROSCOPY;
TEMPERATURE;
ZIRCONIUM COMPOUNDS;
EXTREME CONDITIONS;
HIGH PRESSURE;
HIGH-LOW;
HIGHEST TEMPERATURE;
LEAD ZIRCONATE TITANATE;
LEAD ZIRCONATE-TITANATE;
LOW TEMPERATURE TECHNIQUES;
LOW-TEMPERATURE APPLICATIONS;
LOWER-TEMPERATURE APPLICATIONS;
MONOCLINIC PHASE;
PEROVSKITE;
DIAMOND;
HELIUM;
LEAD;
OXYGEN DERIVATIVE;
PEROVSKITE;
TITANIUM DERIVATIVE;
ZIRCONIUM;
ANALYTICAL EQUIPMENT;
ARTICLE;
CHEMOSENSITIVITY;
CRYSTAL STRUCTURE;
DIAMOND ANVIL CELL;
FROZEN SECTION;
HIGH PRESSURE PROCEDURE;
LOW TEMPERATURE PROCEDURES;
MATERIALS TESTING;
MOLECULAR STABILITY;
PHASE TRANSITION;
PIEZOELECTRICITY;
PRESSURE MEASUREMENT;
RAMAN SPECTROMETRY;
SOLID;
STRUCTURE ANALYSIS;
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EID: 0041761324
PISSN: 03770486
EISSN: None
Source Type: Journal
DOI: 10.1002/jrs.1009 Document Type: Article |
Times cited : (14)
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References (42)
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