Pressure-induced shift and broadening of 1560-1630-nm carbon monoxide wavelength-calibration lines

Journal of the Optical Society of America B: Optical Physics

Volumn 19, Issue 10, 2002, Pages 2461-2467

  Swann, W C ^a   Gilbert, S L ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC FIELD EFFECTS; OPTICAL FIBERS; WAVELENGTH DIVISION MULTIPLEXING;

PRESSURE SHIFT;

CARBON MONOXIDE;

EID: 0041746510     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.19.002461     Document Type: Article

References (14)

1. W. C. Swann and S. L. Gilbert, "Pressure-induced shift and broadening of 1510-1540-nm acetylene wavelength calibration lines," J. Opt. Soc. Am. B 17, 1263-1270 (2000).
2. 2 absorption reference for 1510 nm to 1540 nm wavelength calibration - SRM 2517a," Natl. Inst. Stand. Technol. (US) Spec. Publ. 260-133 (2001).
3. 14N absorption reference for 1530-1560 nm wave-length calibration - SRM 2519," Natl. Inst. Stand. Technol. (US) Spec. Publ. 260-137 (1998).
4. F. Bertinetto, P. Gambini, R. Lano, and M. Puleo, "Stabilization of the emission frequency of 1.54 μm DFB laser diodes to hydrogen iodide," IEEE Photon. Technol. Lett. 4, 472-474 (1993).
5. 16O," J. Mol. Spectrosc. 185, 244-248 (1997).
6. J. Henningsen, H. Simonsen, T. Møgelberg, and E. Trudsø, "The 0 → 3 overtone band of CO: precise linestrengths and broadening parameters," J. Mol. Spectrosc. 193, 354-362 (1999).
7. L. S. Rothman, C. P. Rinsland, A. Goldman, S. T. Massie, D. P. Edwards, J.-M. Flaud, A. Perrin, C. Camy-Peyret, V. Dana, J.-Y. Mandin, J. Schroeder, A. McCann, R. R. Gamache, R. B. Wattson, K. Yoshino, K. V. Chance, K. W. Jucks, L. R. Brown, V. Nemtchinov, and P. Varanasi, "The HITRAN molecular spectroscopic database and HAWKS (HITRAN atmospheric workstation): 1996 edition," J. Quant. Spectrosc. Radiat. Transfer 60, 665-710 (1998); http://www.hitran.com
8. W. Demtröder, Laser Spectroscopy, 2nd ed. (Springer-Verlag, Berlin, 1996), pp. 67-82.
9. P. A. Boggs, R. H. Byrd, J. E. Rogers, and R. B. Schnabel, "Users reference guide for ODRPAC version 2.01 software for weighted orthogonal distance regression," Natl. Inst. Stand. Technol. (US) Interagency Rep. 4834 (1992).
10. K. Nakagawa, M. de Labachelerie, Y. Awaji, and M. Kourogi, "Accurate optical frequency atlas of the 1.5- μm bands of acetylene," J. Opt. Soc. Am. B 13, 2708-2714 (1996).
11. B. N. Taylor and C. E. Kuyatt, "Guidelines for evaluating and expressing the uncertainty of NIST measurement results," Natl. Inst. Stand. Technol. (US) Tech. Note 1297 (1993).
12. G. P. Barwood, P. Gill, and W. R. C. Rowley, "Frequency measurements on optically narrowed Rb-stabilized laser diodes at 780 nm and 795 nm," Appl. Phys. B 53, 142-147 (1991).
13. 3/2 state," Opt. Lett. 21, 1280-1282 (1996).
14. P. L. Varghese and R. K. Hanson, "Collisional narrowing effects on spectral line shapes measured at high resolution," Appl. Opt. 23, 2376-2385 (1984).