Electron multiplying CCDs

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4877, Issue , 2002, Pages 55-68

  Denvir, Donal J ^a   Conroy, Emer ^a  

^a OXFORD INSTRUMENTS PLASMA TECHNOLOGY   (United Kingdom)

Author keywords

Electron multiplying CCD; EMCCD; ICCD; Impact ionisation; Impactron; L3Vision; Low light level

Indexed keywords

ELECTRON MULTIPLIERS; IMPACT IONIZATION; SENSITIVITY ANALYSIS; SILICON; SPURIOUS SIGNAL NOISE;

IMPACTRON;

CHARGE COUPLED DEVICES;

EID: 0041731787     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.463677     Document Type: Article

References (12)

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