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Volumn 30, Issue 8, 1997, Pages 5425-5429

On the reliability of generalized consecutive systems

Author keywords

Connected X out of (m,n):F lattice system; Consecutive k within m out of n:F system; Consecutive k out of n:F system; Consecutively connected system; K within (r,s) out of (m,n):F lattice system; Reliability

Indexed keywords


EID: 0041725776     PISSN: 0362546X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0362-546X(96)00114-9     Document Type: Article
Times cited : (3)

References (14)
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    • Boehme, T.K.1    Kossow, A.2    Preuss, W.3
  • 2
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    • Survey of reliability studies of consecutive-k-out-of-n:F & related systems
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    • (1995) IEEE Transactions on Reliability , vol.44 , Issue.1 , pp. 120-127
    • Chao, M.1    Fu, J.2    Koutras, M.3
  • 3
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    • A recursive algorithm evaluating the exact reliability of a consecutive-k-within-m-out-of-n:F system
    • J. Malinowski and W. Preuss, A recursive algorithm evaluating the exact reliability of a consecutive-k-within-m-out-of-n:F system, Microelectron. Reliab., vol. 35, No. 12, pp. 1461-1465 (1995).
    • (1995) Microelectron. Reliab. , vol.35 , Issue.12 , pp. 1461-1465
    • Malinowski, J.1    Preuss, W.2
  • 5
    • 85033103787 scopus 로고    scopus 로고
    • A recursive algorithm evaluating the exact reliability of a circular consecutive-k-within-m-out-of-n:F system
    • accepted
    • J. Malinowski and W. Preuss, A recursive algorithm evaluating the exact reliability of a circular consecutive-k-within-m-out-of-n:F system, Microelectron. Reliab. (accepted).
    • Microelectron. Reliab.
    • Malinowski, J.1    Preuss, W.2
  • 6
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    • Reliability evaluation for tree-structured systems with multistate components
    • J. Malinowski and W. Preuss, Reliability evaluation for tree-structured systems with multistate components, Microelectr. Reliab., vol. 36, No. 1, pp. 9-17 (1996).
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    • Malinowski, J.1    Preuss, W.2
  • 7
    • 0029768523 scopus 로고    scopus 로고
    • Reliability of reverse-tree-structured systems with multistate components
    • J. Malinowski and W. Preuss, Reliability of reverse-tree-structured systems with multistate components, Microelectr. Reliab., vol. 36, No. 1, pp. 1-7 (1996).
    • (1996) Microelectr. Reliab. , vol.36 , Issue.1 , pp. 1-7
    • Malinowski, J.1    Preuss, W.2
  • 8
    • 85033102317 scopus 로고    scopus 로고
    • Reliability of a 2-way linear consecutively connected system with multistate components
    • accepted
    • J. Malinowski and W. Preuss, Reliability of a 2-way linear consecutively connected system with multistate components, Microelectr. Reliab.(accepted).
    • Microelectr. Reliab.
    • Malinowski, J.1    Preuss, W.2
  • 9
    • 85033126484 scopus 로고    scopus 로고
    • Reliability of 2-way circular consecutively connected system with multistate components
    • submitted
    • J. Malinowski and W. Preuss, Reliability of 2-way circular consecutively connected system with multistate components, Microelectr. Reliab.(submitted).
    • Microelectr. Reliab.
    • Malinowski, J.1    Preuss, W.2
  • 10
    • 85033102561 scopus 로고    scopus 로고
    • Reliability increase of consecutive k-out-of-n:F and related systems through components' rearrangement
    • accepted
    • J. Malinowski and W. Preuss, Reliability increase of consecutive k-out-of-n:F and related systems through components' rearrangement, Microelectr. Reliab.(accepted).
    • Microelectr. Reliab.
    • Malinowski, J.1    Preuss, W.2
  • 11
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    • A parallel algorithm evaluating the reliability of a system with known minimal cuts (paths)
    • accepted
    • J. Malinowski and W. Preuss, A parallel algorithm evaluating the reliability of a system with known minimal cuts (paths), Microelectr. Reliab.(accepted).
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    • Malinowski, J.1    Preuss, W.2
  • 13
    • 0027663691 scopus 로고
    • Reliability of a general consecutive k-out-of-n:F system
    • M. Sfakianakis and S.G. Papastavridis, Reliability of a general consecutive k-out-of-n:F system, IEEE Transactions on Reliability, vol. 42, No. 3, pp. 491-496 (1993).
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    • Sfakianakis, M.1    Papastavridis, S.G.2
  • 14
    • 0029328114 scopus 로고
    • Reliability of a linear connected-(r,s)-out-of-(m,n):F lattice system
    • H. Yamamoto and M. Miyakawa, Reliability of a linear connected-(r,s)-out-of-(m,n):F lattice system, IEEE Trans. Reliab. vol 44, pp. 333-336 (1995).
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    • Yamamoto, H.1    Miyakawa, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.