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Volumn 217, Issue 7, 2003, Pages 847-861
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The network-chain transformation in the liquid As-Te mixtures near the semiconductor-metal transition
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Author keywords
Liquid Chalcogen Mixtures; Neutron Diffraction and EXAFS; Semiconductor Metal Transition
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Indexed keywords
ATOMS;
MIXTURES;
NEUTRON DIFFRACTION;
SEMICONDUCTING TELLURIUM;
CHALCOGENS;
EXAFS;
FIRST SHARP DIFFRACTION PEAK;
INTERMEDIATE RANGE ORDER;
NETWORK STRUCTURES;
SEMICONDUCTOR-METAL TRANSITION;
SEMICONDUCTOR-TO-METAL TRANSITIONS;
THERMAL FLUCTUATIONS;
SEMICONDUCTING TELLURIUM COMPOUNDS;
ARSENIC;
METAL;
TELLURIUM;
ARTICLE;
ATOM;
CHEMICAL STRUCTURE;
CORRELATION ANALYSIS;
DIFFRACTION;
HIGH TEMPERATURE;
LIQUID;
NEUTRON;
SEMICONDUCTOR;
THERMAL ANALYSIS;
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EID: 0041700120
PISSN: 09429352
EISSN: None
Source Type: Journal
DOI: 10.1524/zpch.217.7.847.20391 Document Type: Article |
Times cited : (2)
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References (20)
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