Measurements of contact potential difference (work functions) of metals and semiconductors surface by the static ionized capacitor method

Advances in Colloid and Interface Science

Volumn 105, Issue 1-3, 2003, Pages 329-339

  Novikov, Sergey Nikolaevich ^a   Timoshenkov, Sergey Petrovich ^a  

^a NATIONAL RESEARCH UNIVERSITY OF ELECTRONIC TECHNOLOGY   (Russian Federation)

Author keywords

Potential; Static ionized capacitor; Surface; Work function

Indexed keywords

CAPACITORS; ELECTRIC POTENTIAL; IONIZATION; MICROELECTROMECHANICAL DEVICES;

WORK FUNCTION;

SURFACE PHENOMENA;

ALUMINUM; GOLD; ION; METAL; OXYGEN; SILICON; WATER;

ARTICLE; CHEMISTRY; ELECTROCHEMISTRY; ELECTRON; METABOLISM; METHODOLOGY; TEMPERATURE; TIME;

ALUMINUM; ELECTROCHEMISTRY; ELECTRONS; GOLD; IONS; METALS; OXYGEN; SILICON; TEMPERATURE; TIME FACTORS; WATER;

EID: 0041692769     PISSN: 00018686     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0001-8686(03)00051-4     Document Type: Article

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