Determination of dopants in ZnO-based ceramic varistors by x-ray fluorescence and inductively coupled plasma spectrometry

X-Ray Spectrometry

Volumn 30, Issue 4, 2001, Pages 273-279

  Caballero, A C ^a   Valle, F J ^a   Martin Rubi J A ^b  

^a INSTITUTO DE CERÁMICA Y VIDRIO   (Spain)

^b INSTITUTO GEOLÓGICO Y MINERO DE ESPAÑA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC EMISSION SPECTROSCOPY; BISMUTH COMPOUNDS; CERAMIC MATERIALS; DOPING (ADDITIVES); FLUORESCENCE; II-VI SEMICONDUCTORS; INDUCTIVELY COUPLED PLASMA; SPECTROMETRY; ZINC OXIDE;

CERAMIC VARISTOR; DOPANT CONCENTRATIONS; GLASS BEAD; INDUCTIVELY COUPLED PLASMA SPECTROMETRY; THERMAL BEHAVIOURS; VOLATILISATION; X RAY FLUORESCENCE; X RAY FLUORESCENCE ANALYSIS; ZNO CERAMIC; ZNO-BASED CERAMICS;

THERMOGRAVIMETRIC ANALYSIS;

EID: 0041691308     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.498     Document Type: Article

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