Particle imaging technique for measuring the deformation rate of hydrogel microstructures

Applied Physics Letters

Volumn 76, Issue 22, 2000, Pages 3310-3312

  Olsen, Michael G ^a   Bauer, Joseph M ^a   Beebe, David J ^b  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^b UNIVERSITY OF WISCONSIN MADISON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041689466     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.126635     Document Type: Article

References (11)

1. T. Tanaka, D. Filmore, S.-T. Sun, I. Nishio, G. Swislow, and A. Shah, Phys. Rev. Lett. 45, 1636 (1980).
2. J. Constance, J. Mech. Eng. 113, 51 (1991).
3. S. Geherke, G. Andrews, and E. Cussler, Chem. Eng. Sci. 41, 2153 (1986).
4. T. Tanaka, E. Sato, Y. Hirokawa, S. Hirotsu, and J. Peetermans. Phys. Rev. Lett. 55, 2455 (1985).
5. T. Ikehara, T. Nishi, and T. Hayashi, Polym. J. (Tokyo) 28, 169 (1996).
6. S. Schlick, J. Pilar, S.-C. Kweon, J. Vacik, Z. Gao, and J. Labsky, Macromolecules 28, 5780 (1995).
7. J. Santiago, S. Wereley, C. Meinhart, D. Beebe, and R. Adrian, Exp. Fluids 25, 316 (1998).
8. D. Beebe, J. Moore, J. Bauer, Q. Yu, R. Liu, C. Devadoss, and B.-H. Jo, Nature (London) 404, 588 (2000).
9. R. Keane and R. Adrian. Appl. Sci. Res. 49, 191 (1992).
10. M. Olsen and R. Adrian, Exp. Fluids (to be published).
11. A. Prasad, R. Adrian, C. Landreth, and P. Offutt, Exp. Fluids 13, 105 (1992).