In situ sequential STM imaging of structural changes resulting from the electrodissolution of silver crystal surfaces in aqueous perchloric acid: The roughening kinetics

Physical Review B - Condensed Matter and Materials Physics

Volumn 53, Issue 15, 1996, Pages 10217-10224

  Vela, M ^a   Andreasen, G ^a   Salvarezza, R ^a   Hernandez Creus A ^a   Arvia, A ^a  

^a INSTITUTO DE INVESTIGACIONES FISICOQUÍMICAS TEÓRICAS Y APLICADAS INIFTA   (Argentina)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041654057     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.53.10217     Document Type: Article

References (38)

1. G. Daccord, in The Fractal Approach to the Heterogeneous Chemistry, edited by D. Avnir (Wiley, New York, 1989), p. 183.
2. K. Sieradzki, J. Electrochem. Soc. 140, 2868 (1983).
3. J. R. Galvele, Corros. Sci. 27, 1 (1987).
4. P. Meakin, P. Ramanlal, L. M. Sander and R. C. Ball, Phys. Rev. A 34, 509 (1986).
5. F. Family, Physica A 168, 561 (1990), and references therein.
6. P. Meakin, in The Fractal Approach to the Heterogeneous Chemistry (Ref. 1), p. 131.
7. M. I. J. Beale, J. D. Benjamin, M. J. Uren, N. G. Chew and A. G. Cullis, J. Cryst. Growth 75, 408 (1986).
8. T. A. Witten and L. M. Sander, Phys. Rev. Lett. 47, 1400 (1981).
9. P. Evesque, in The Fractal Approach to the Heterogeneous Chemistry (Ref. 1), p. 81.
10. A. Iwamoto, T. Yoshinobu and H. Iwasaki, Phys. Rev. Lett. 72, 4025 (1994).
11. P. Ocón, P. Herrasti, J. M. Vara, L. Vázquez, R. C. Salvarezza and A. J. Arvia, J. Phys. Chem. 98, 2418 (1994).
12. D. W. Suggs and A. J. Bard, J. Am. Chem. Soc. 116, 10t725 (1994).
13. W. Mehl and J. O'M. Bockris, Can. J. Chem. 37, 190 (1959).
14. A. V. Vvedenskii and I. K. Marshakov, Russ. J. Electrochem. 31, 234 (1995).
15. D. W. Suggs and A. J. Bard, J. Phys. Chem. 99, 8349 (1995).
16. M. Eden, in Proceedings of the 4th Berkeley Symposium on Mathematical Statics and Probability, edited by F. Neyman (University of California Press, Berkeley, 1961), Vol. 4.
17. G. H. Gilmer and P. Bennema, J. Appl. Phys. 43, 1347 (1992).
18. M. Kardar, G. Parisi and Y. C. Zhang, Phys. Rev. Lett. 56, 889 (1986).
19. D. E. Wolf and J. Villain, Europhys. Lett. 13, 389 (1990).
20. J. Villain, J. Phys. (France) I 1, 19 (1992).
21. M. Siegert and M. Plischke, Phys. Rev. Lett. 73, 1517 (1994).
22. Z. W. Lai and S. Das Sarma, Phys. Rev. Lett. 66, 2348 (1991).
23. L. Vázquez, R. C. Salvarezza, P. Herrasti, P. Ocón, J. M. Vara, and A. J. Arvia, Appl. Surf. Sci. 70-71, 413 (1993).
24. J. Krim, I. Heyvaert, C. Van Haesendonck and Y. Bruynseraede, Phys. Rev. Lett. 70, 57 (1993).
25. L. Vázquez, A. Hernández-Creus, P. Carro, P. Ocón, P. Herrasti, C. Palacio, J. M. Vara, R. C. Salvarezza and A. J. Arvia, J. Phys. Chem. 96, 10t454 (1992).
26. R. C. Salvarezza, L. Vázquez, P. Herrasti, P. Ocón, J. M. Vara and A. J. Arvia, Europhys. Lett. 20, 727 (1992).
27. C. Thompson, G. Palasantzas, Y. P. Feng, S. K. Sinha and J. Krim, Phys. Rev. B 49, 4902 (1994).
28. P. Pfeifer, Y. J. Wu, M. W. Cole and J. Krim, Phys. Rev. Lett. 62, 1997 (1989).
29. M. Dietterle, T. Will and D. Kolb, Surf. Sci. 327, L495 (1995).
30. J. S. Chen, T. M. Devine, D. F. Ogletree, and D. M. Salmeron, Surf. Sci. 258, (1991).
31. A. Otto, Phys. Rev. B 27, 5132 (1983).
32. H. Gerischer and R. P. Tischer, Z. Elektrochem. 61, 1159 (1957).
33. A. Hernández-Creus, P. Carro, R. C. Salvarezza and A. J. Arvia, J. Electrochem. Soc. 142, 3806 (1995).
34. L. Vázquez, R. C. Salvarezza, P. Herrasti, P. Ocón, J. M. Vara and A. J. Arvia, Phys. Rev. B 52, 2032 (1995).
35. Z. Zhang, J. Detch and H. Matiu, Phys. Rev. B 48, 4972 (1993).
36. G. E. Rhead, Surf. Sci. 47, 207 (1975), and references therein.
37. M. P. García, M. M. Gómez, R. C. Salvarezza and A. J. Arvia, J. Electroanal. Chem. 347, 237 (1993).
38. C. Alonso, R. C. Salvarezza, J. M. Vara and A. J. Arvia, Electrochim. Acta 35, 1331 (1990).