Design of high-Q frequency-temperature compensated dielectric resonators

Electronics Letters

Volumn 35, Issue 4, 1999, Pages 303-305

  Tobar, M E ^a   Hartnett, J G ^a   Cros, D ^b   Blondy, P ^b   Krupka, J ^c   Ivanov, E N ^a   Guillon, P ^b  

^a UNIVERSITY OF WESTERN AUSTRALIA   (Australia)

^b UNIVERSITY OF LIMOGES   (France)

^c WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041627575     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19990205     Document Type: Article

References (8)

1. IVANOV, E.N., TOBAR, M.E., and WOODE, R.A.: 'Applications of interferometric signal processing to phase noise reduction in microwave oscillators', IEEE Trans., 1998, MTT-46, pp. 1537-1545
2. LUITEN, A.N.: 'Sapphire secondary frequency standards'. PhD Thesis, University of Western Australia, 1995, p. 164
3. MANN, A.G., GILES, A.J., BLAIR, D.G., and BUCKINGHAM, M.J.: 'Ultrastable cryogenic sapphire dielectric microwave resonators: mode frequency-temperature compensation by residual paramagnetic impurities', J. Phys. D: Appl. Phys., 1992, 25, pp. 1105-1109
4. TOBAR, M.E., KRUPKA, J., HARTNETT, J.G., IVANOV, E.N., and WOODE, R.A.: 'High-Q sapphire-rutile frequency-temperature compensated microwave dielectric resonators', IEEE Trans., 1998, UFFC-45, pp. 830-836
5. TOBAR, M.E., KRUPKA, J., IVANOV, E.N., and WOODE, R.A.: 'Dielectric frequency-temperature-compensated microwave whispering-gallery-mode resonators', J. Phys. D: Appl. Phys., 1997, 30, pp. 2770-2775
6. TOBAR, M., KRUPKA, J., IVANOV, E., and WOODE, R.: 'Anisotropic complex permittivity measurements of mono-crystalline rutile between 10-300 Kelvin', J. Appl. Phys., 1998, 83, pp. 1604-1609
7. KRUPKA, J., DERZAKOWSKI, K., ABRAMOWICZ, A., TOBAR, M.E., and GEYER, R.: 'Whispering gallery modes for complex permittivity measurements of ultra-low loss dielectric materials', to be published in IEEE Trans. MTT., 1999, 47,
8. AUBOURG, M., and GUILLON, P.: 'A mixed finite element formulation for microwave device problems. Application to MIS structure', J. Electromag. Waves Applic., 1991, 45, pp. 371-386