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Volumn 5024, Issue , 2003, Pages 117-127
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Raman scattering and microstructural analysis of polycrystalline CuInS2 films for solar cell devices
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Author keywords
AES; Chalcopyrite; CuInS2; Raman scattering; Secondary phases; Solar cells; TEM; Thin films
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Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
COMPOSITION;
COPPER COMPOUNDS;
DEGRADATION;
GRAIN SIZE AND SHAPE;
RAMAN SCATTERING;
SEMICONDUCTOR MATERIALS;
SOLAR CELLS;
TEMPERATURE;
TRANSMISSION ELECTRON MICROSCOPY;
CHALCOPYRITE;
MICROSTRUCTURAL ANALYSIS;
POLYCRYSTALLINE FILMS;
SOLAR CELL DEVICES;
POLYCRYSTALLINE MATERIALS;
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EID: 0041624569
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.497250 Document Type: Conference Paper |
Times cited : (2)
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References (9)
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