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Volumn 5024, Issue , 2003, Pages 117-127

Raman scattering and microstructural analysis of polycrystalline CuInS2 films for solar cell devices

Author keywords

AES; Chalcopyrite; CuInS2; Raman scattering; Secondary phases; Solar cells; TEM; Thin films

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; COMPOSITION; COPPER COMPOUNDS; DEGRADATION; GRAIN SIZE AND SHAPE; RAMAN SCATTERING; SEMICONDUCTOR MATERIALS; SOLAR CELLS; TEMPERATURE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0041624569     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.497250     Document Type: Conference Paper
Times cited : (2)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.