Extended analysis of curvature sensing

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 19, Issue 7, 2002, Pages 1390-1397

  Van Dam, Marcos A ^a   Lane, Richard G ^a  

^a UNIVERSITY OF CANTERBURY   (New Zealand)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; DIFFRACTION; PHOTONS; WAVEFRONTS;

CURVATURE SENSORS;

SENSORS;

EID: 0041622654     PISSN: 10847529     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAA.19.001390     Document Type: Article

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