Modulated thermal profiling on devices

Progress in Natural Science

Volumn 6, Issue SPEC. ISS., 1996, Pages

  Maywald, M ^a  

^a UNIVERSITY OF WUPPERTAL   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

HEAT SOURCES; SCANNING FORCE MICROSCOPES; THERMAL PROFILING; THERMAL STRUCTURE;

EID: 0041620688     PISSN: 10020071     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (5)

1. Williams C.C., Wickramasinghe H.K.: Scanning thermal profiler. Appl. Phys. Lett., Vol 49 (23) (1986), p.1587/1589
2. Majumdar A., Carrejo J.P., Lai J. Thermal imaging using the atomic force microscope. Appl. Phys. Lett., Vol.62 (20) (1993), p. 2501/2503
3. Dinwiddie R.B., Pylkki R.J., West P.E. Thermal conductivity contrast imaging with a scanning thermal microscope, in: Thermal Conductivity 22, Technomic Publishing Co, Lancaster, Basel, p. 668/677
4. Stopka M., Oesterschulze E., Schulte J., Kassing R.: Photothermal scanning near-field microscopy. Materials Science and Engineering B, Vol 24 (1994), p. 226/228
5. Opsal J., Rosencwaig A.: Thermal-wave depth profiling: theory. J. Appl. Phys. Vol 53 (6) (1982), p.4240/4246