Investigation of soft upsets in integrated circuit memories and charge collection in semiconductor test structures by the use of an ion microbeam

Nuclear Instruments and Methods In Physics Research

Volumn 218, Issue 1-3, 1983, Pages 625-631

  Knudson, A R ^a   Campbell, A B ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ION BEAMS - APPLICATIONS;

INTEGRATED CIRCUITS, DIGITAL;

EID: 0041615233     PISSN: 01675087     EISSN: None     Source Type: Journal    
DOI: 10.1016/0167-5087(83)91054-2     Document Type: Article

References (9)

1. Alpha-particle-induced soft errors in dynamic memories
2. Alpha-particle tracks in silicon and their effect on dynamic MOS RAM reliability
3. IEEE Elect. Dev. Lett. EDL-2
4. IEEE 19th Annual Proc., Reliability physics 1981
5. Alpha-particle-induced field and enhanced collection of carriers
6. Collection of Charge on Junction Nodes from Ion Tracks
7. Charge Collection Measurements for Energetic Ions in Silicon
8. Applications of a Microbeam to the Problem of Soft Upsets in Integrated Circuit Memories