Depth-dependent x-ray diffraction using extremely asymmetric reflections

Journal of Physics D: Applied Physics

Volumn 31, Issue 22, 1998, Pages 3272-3278

  Ress, H R ^a   Faschinger, W ^a   Landwehr, G ^a  

^a UNIVERSITY OF WÜRZBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE ABSORPTION; ELECTROMAGNETIC WAVE REFLECTION; VECTORS; X RAY DIFFRACTION ANALYSIS; X RAY SCATTERING;

ASYMMETRIC REFLECTION;

HETEROJUNCTIONS;

EID: 0041595563     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/31/22/016     Document Type: Article

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